As per Future Market Insights’ updated report, the global wafer testing service market size is set to reach USD 9,823.6 ...

Predictive modeling, strategic sampling and embedded monitors help accelerate testing for yield limiting defects.

and it is driving innovations in both inspection techniques and wafer test map analysis. At the wafer level, a macro-defect can affect more than one die, and in some cases large regions of a wafer.

AOIFE WAFER HAS lost her race for fitness ahead of this Saturday’s Guinness Women’s Six Nations meeting with Scotland due to ...

NORTH READING, Mass., March 31, 2025--(BUSINESS WIRE)--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics ...

“We believe on-wafer testing systems should be as straightforward as possible,” said Jens Klattenhoff, VP and GM of the Systems Business Unit at FormFactor. “That is why we designed the ...

Aehr Test Systems, Inc. provides test solutions for testing, burning-in, and semiconductor devices in wafer level, singulated die, package part form, and installed systems worldwide. Its product ...

This acquisition will enable Teradyne to deliver scalable photonic integrated circuit (PIC) test solutions. PIC technology is leveraging wafer-based manufacturing, multi-die integration ...

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...

a global leader in production solutions for photonics assembly and test, to announce the availability of the first high-volume, double-sided wafer probe test cell for silicon photonics.